Innovative organic semiconducor technology
Compatible with existing machine vision systems
Wide spectral imaging in multiple scenes
High-resolution imaging
The next-generation Visible-Near Infrared Enhanced Image Detector Pi0130 adopts Lumidar's independently developed patented PiNIR™ sensor technology. With a high-resolution detection capability of 1280×1024, it delivers richer detail and superior signal-to-noise performance across the visible to near-infrared spectrum. This sensor accurately captures subtle feature variations and is professionally designed for cutting-edge fields that demand extreme resolution, such as semiconductor inspection, high-precision medical detection, and scientific research.Through disruptive organic semiconductor design, cost-effective wide-spectrum, high-sensitivity near-infrared perception is achieved, improving quantum efficiency by 200% in near-infrared bands such as 940nm, 1064nm, and 1135nm.
Utilizing 1280×1024 high-resolution design with extremely low dark current density and global shutter architecture, significantly enhancing imaging quality and dynamic capture capabilities.
|
P/N |
Pi0130 | |
| Array Format | 1280(H)x1024(V) | |
| Pixel Pitch | 7.5 μm | |
| Spectral Range | 0.3 μm-1.3 μm | |
| Frame Rate | 120Hz | |
| Package | LCC84 | |
| Quantum Efficiency | 60 | |
| Operable Pixel Rate | > 99.5% | |
| Power Consumption | 500mW@ 60Hz | |
| Readout Mode | CDS, ITR, IWR, NDRO, IMRO | |
| Specific Detectivity | >1011 Jones | |
| Shutter Type | Global | |
| Non-uniformity | <4% | |
Product Dimensions (Unit: mm)
The Pi0130 chip evaluation kit is now available for pre-order, providing a comprehensive development board with complete hardware and software to simplify and accelerate your evaluation process.
This ready-to-use solution enables you to quickly test the chip's imaging performance in real-world application scenarios, allowing you to begin evaluation without additional configuration.
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